|
|
Fabrication of Nanostructures and Nanodevices for Nanoelectronics and Spintronics
Lišková, Zuzana ; Červenka, Jiří (referee) ; Čech, Vladimír (referee) ; Šikola, Tomáš (advisor)
The thesis deals with preparation of graphene nanostructures and their applications in the measurement of transport properties of graphene. The contacts for measurement of resistance are fabricated by electron beam lithography on graphene exfoliated flakes, CVD graphene layers and grains. Graphene is also shaped using the same method. Resistivity of the layer, concentration and mobility of charge carriers are determined by different approaches. Hysteresis appearing in dependence of resistivity on the gate voltage is discussed as well. A significant part of the work is dedicated to monitoring the response of graphene resistance to relative humidity changes and potential use of graphene as a sensor of relative humidity.
|
|
|
Uncertainty and Compatibility in Measurement
Kvapil, Josef ; Zavřel, Jiří (referee) ; Havlíková, Marie (advisor)
This work is concerning the matter of resistor and inductance measurement uncertainty. It addresses the elaboration of general measurement uncertainty processes for the measurements mentioned above using Agilent 4263B, Tesla BM507 and Tesla BM591 measurement instruments. This bachelor’s thesis describes possible sources of measurement uncertainty that might arise from the use of these measurement instruments. It also describes practical examples of resistivity and induction standard measurement projects using these measurement instruments followed by a compatibility evaluation of these measurements.
|
|
|
Fabrication of Nanostructures and Nanodevices for Nanoelectronics and Spintronics
Lišková, Zuzana ; Červenka, Jiří (referee) ; Čech, Vladimír (referee) ; Šikola, Tomáš (advisor)
The thesis deals with preparation of graphene nanostructures and their applications in the measurement of transport properties of graphene. The contacts for measurement of resistance are fabricated by electron beam lithography on graphene exfoliated flakes, CVD graphene layers and grains. Graphene is also shaped using the same method. Resistivity of the layer, concentration and mobility of charge carriers are determined by different approaches. Hysteresis appearing in dependence of resistivity on the gate voltage is discussed as well. A significant part of the work is dedicated to monitoring the response of graphene resistance to relative humidity changes and potential use of graphene as a sensor of relative humidity.
|
|
|
Uncertainty and Compatibility in Measurement
Kvapil, Josef ; Zavřel, Jiří (referee) ; Havlíková, Marie (advisor)
This work is concerning the matter of resistor and inductance measurement uncertainty. It addresses the elaboration of general measurement uncertainty processes for the measurements mentioned above using Agilent 4263B, Tesla BM507 and Tesla BM591 measurement instruments. This bachelor’s thesis describes possible sources of measurement uncertainty that might arise from the use of these measurement instruments. It also describes practical examples of resistivity and induction standard measurement projects using these measurement instruments followed by a compatibility evaluation of these measurements.
|
|
| |
guest ::
